Live Webinar and Q&A with Aksel – Thursday, September 19th at 8:30 am mountain
We are continuing our Member webinar series with a review of the most reliable chart patterns Tech Charts Global Equity Markets report featured over the past two years. We will go through numbers on chart pattern reliability. Since May 2017, Global Equity Markets report featured classical chart pattern breakouts. Out of those, most reliable were H&S bottom, rectangle, and descending triangle. We will review under which conditions these chart patterns reached their price objectives.
Given the current market conditions, the webinar will review some of the important charts that are at inflection points. Global equities can start new medium-term trends and it is important to review some of the charts that could signal the beginning of strength.
Scheduled for: Thursday, September 19th at 8:30 am mountain (register below)
Read MoreGLOBAL EQUITY MARKETS – September 7, 2019
REVIEW
The minor consolidation between 70 and 72.5 is completed on the upside. The benchmark for the Global equity markets performance, the iShares MSCI All Country World Index ETF (ACWI.O) remains in a wider trading range between 70 and 74.8 levels. A long-term breakout will take place only if the ETF clears the horizontal resistance at 74.8 levels. Larger scale chart pattern can be identified as a H&S continuation.
Read MoreGLOBAL EQUITY MARKETS – August 31, 2019
REVIEW
The benchmark for the Global equity markets performance, the iShares MSCI All Country World Index ETF (ACWI.O) formed a short-term consolidation range between 70 and 72.5 levels. The larger scale consolidation is between 70 and 74.8 levels. The boundaries have become well-defined. Breakout above the minor resistance at 72.5 levels can send the ETF towards the resistance at 74.8 levels. Failure at the minor resistance can result in further sideways consolidation between 72.5 and 70 levels. How the ETF resolves from the recent tight consolidation will decide on the last quarter performance for Global equities.
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